Topological edge spectrum along curved interface 

Xiaowen Zhu, University of Washington
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PDL C-038
Topological insulators (TI) are a class of 2D materials which behave like insulators in their bulk but support robust states along their edges. One of the key property of TI that is expected to be true is the robustness of the property above w.r.t. the shape of the edge. In this talk, we will discuss how does shape of edge influence the property of TI above. In particular, we will both give a general, intuitive condition for this property to hold, and provide a counter-example otherwise. We also show why in practical situation, experiments may provide misleading results on TI. This work is based on a joint work with Alexis Drouot.
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